Kinetics and coverage dependent reaction mechanisms of the copper atomic layer deposition from copper dimethylamino-2-propoxide and diethylzinc

dc.check.date2017-08-11
dc.check.infoAccess to this article is restricted until 12 months after publication by the request of the publisher.en
dc.contributor.authorMaimaiti, Yasheng
dc.contributor.authorElliott, Simon D.
dc.contributor.funderScience Foundation Irelanden
dc.contributor.funderHigher Education Authorityen
dc.date.accessioned2016-11-03T10:23:56Z
dc.date.available2016-11-03T10:23:56Z
dc.date.issued2016-08-11
dc.date.updated2016-11-03T10:13:48Z
dc.description.abstractAtomic layer deposition (ALD) has been recognized as a promising method to deposit conformal and uniform thin film of copper for future electronic devices. However, many aspects of the reaction mechanism and the surface chemistry of copper ALD remain unclear. In this paper, we employ plane wave density functional theory (DFT) to study the transmetalation ALD reaction of copper dimethylamino-2-propoxide [Cu(dmap)2] and diethylzinc [Et2Zn] that was realized experimentally by Lee et al. [ Angew. Chem., Int. Ed. 2009, 48, 4536−4539]. We find that the Cu(dmap)2 molecule adsorbs and dissociates through the scission of one or two Cu–O bonds into surface-bound dmap and Cu(dmap) fragments during the copper pulse. As Et2Zn adsorbs on the surface covered with Cu(dmap) and dmap fragments, butane formation and desorption was found to be facilitated by the surrounding ligands, which leads to one reaction mechanism, while the migration of ethyl groups to the surface leads to another reaction mechanism. During both reaction mechanisms, ligand diffusion and reordering are generally endothermic processes, which may result in residual ligands blocking the surface sites at the end of the Et2Zn pulse, and in residual Zn being reduced and incorporated as an impurity. We also find that the nearby ligands play a cooperative role in lowering the activation energy for formation and desorption of byproducts, which explains the advantage of using organometallic precursors and reducing agents in Cu ALD. The ALD growth rate estimated for the mechanism is consistent with the experimental value of 0.2 Å/cycle. The proposed reaction mechanisms provide insight into ALD processes for copper and other transition metals.en
dc.description.sponsorshipScience Foundation Ireland (ALDesign Project 09.IN1.I2628, Irish Centre for High Performance Computing (ICHEC)); Higher Education Authority (Irish Centre for High Performance Computing (ICHEC))en
dc.description.statusPeer revieweden
dc.description.versionAccepted Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.citationMaimaiti, Yasheng; Elliott, Simon D. (2016) 'Kinetics and coverage dependent reaction mechanisms of the copper atomic layer deposition from copper dimethylamino-2-propoxide and diethylzinc'. Chemistry Materials, 28 (17) :6282-6295. doi: 10.1021/acs.chemmater.6b02522en
dc.identifier.doi10.1021/acs.chemmater.6b02522
dc.identifier.endpage6295en
dc.identifier.issn0897-4756
dc.identifier.issued17en
dc.identifier.journaltitleChemistry Materialsen
dc.identifier.startpage6282en
dc.identifier.urihttps://hdl.handle.net/10468/3236
dc.identifier.volume28en
dc.language.isoenen
dc.publisherAmerican Chemical Societyen
dc.relation.urihttp://pubs.acs.org/doi/abs/10.1021/acs.chemmater.6b02522
dc.rightsThis document is the Accepted Manuscript version of a Published Work that appeared in final form in Chemistry Materials, copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see http://pubs.acs.org/doi/abs/10.1021/acs.chemmater.6b02522en
dc.subjectDensity-functional theoryen
dc.subjectMinimum energy pathsen
dc.subjectElastic band methoden
dc.subjectAmidinate precursoren
dc.subjectMolecular-dynamicsen
dc.subjectSurface-chemistryen
dc.subjectHydrogen plasmaen
dc.subjectReducing agenten
dc.subject1st principlesen
dc.subjectSaddle-pointsen
dc.titleKinetics and coverage dependent reaction mechanisms of the copper atomic layer deposition from copper dimethylamino-2-propoxide and diethylzincen
dc.typeArticle (peer-reviewed)en
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