Optical emission of strained direct-band-gap Ge quantum well embedded inside InGaAs alloy layers
Loading...
Files
Published Version
Date
2013-04-25
Authors
Pavarelli, Nicola
Ochalski, Tomasz J.
Murphy-Armando, Felipe
Huo, Y.
Schmidt, Michael
Huyet, Guillaume
Harris, J. S.
Journal Title
Journal ISSN
Volume Title
Publisher
American Physical Society
Published Version
Abstract
We studied the optical properties of a strain-induced direct-band-gap Ge quantum well embedded in InGaAs. We showed that the band offsets depend on the electronegativity of the layer in contact with Ge, leading to different types of optical transitions in the heterostructure. When group-V atoms compose the interfaces, only electrons are confined in Ge, whereas both carriers are confined when the interface consists of group-III atoms. The different carrier confinement results in different emission dynamics behavior. This study provides a solution to obtain efficient light emission from Ge.
Description
Keywords
Germanium , Band offsets , Carrier confinements , Emission dynamics , InGaAs alloys , Optical emissions , Ge quantum well
Citation
Pavarelli, N., Ochalski, T. J., Murphy-Armando, F., Huo, Y., Schmidt, M., Huyet, G. & Harris, J. S. (2013) ‘Optical Emission of a Strained Direct-Band-Gap Ge Quantum Well Embedded Inside InGaAs Alloy Layers’, Physical Review Letters, 110, 177404. http://dx.doi.org/10.1103/PhysRevLett.110.177404
Link to publisher’s version
Copyright
© 2013 American Physical Society