Linear model-based testing of ADC nonlinearities
| dc.contributor.author | Wegener, Carsten | |
| dc.contributor.author | Kennedy, Michael Peter | |
| dc.contributor.funder | Enterprise Ireland | en |
| dc.contributor.funder | Analog Devices | en |
| dc.date.accessioned | 2010-04-21T13:01:26Z | |
| dc.date.available | 2010-04-21T13:01:26Z | |
| dc.date.issued | 2004-01 | |
| dc.date.updated | 2010-03-26T13:51:06Z | |
| dc.description.abstract | In this brief, we demonstrate the procedures of linear model-based testing for the example of a 12-b Nyquist-rate analog-to-digital converter (ADC). In a production test environment, we apply this technique to two wafer lots of devices, and we establish that the model is robust with respect to its ability to reduce the uncertainty of the test outcome. Reducing this uncertainty is particularly beneficial for higher resolution devices, for which measurement noise increasingly corrupts the measured "signal" that is the nonlinearity of the device under test. | en |
| dc.description.status | Peer reviewed | en |
| dc.description.version | Published Version | en |
| dc.format.mimetype | application/pdf | en |
| dc.identifier.citation | Wegener, C., Kennedy, M.P., 2004. Linear model-based testing of ADC nonlinearities. IEEE Transactions on Circuits and Systems I: Regular Papers, 51(1), pp. 213- 217. doi: 10.1109/TCSI.2003.821281 | en |
| dc.identifier.doi | 10.1109/TCSI.2003.821281 | |
| dc.identifier.endpage | 217 | en |
| dc.identifier.issn | 1549-8328 | |
| dc.identifier.issued | 1 | en |
| dc.identifier.journaltitle | IEEE Transactions on Circuits and Systems I: Regular Papers | en |
| dc.identifier.startpage | 213 | en |
| dc.identifier.uri | https://hdl.handle.net/10468/161 | |
| dc.identifier.volume | 51 | en |
| dc.language.iso | en | en |
| dc.publisher | IEEE | en |
| dc.rights | ©2004 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. | en |
| dc.subject | Linear modeling | en |
| dc.subject | Noise-induced test uncertainty | en |
| dc.subject | Specification test | en |
| dc.subject | Test cost reduction | en |
| dc.subject.lcsh | Integrated circuits -- Testing | en |
| dc.subject.lcsh | Analog-to-digital converters | en |
| dc.title | Linear model-based testing of ADC nonlinearities | en |
| dc.type | Article (peer-reviewed) | en |
