Linear model-based testing of ADC nonlinearities

dc.contributor.authorWegener, Carsten
dc.contributor.authorKennedy, Michael Peter
dc.contributor.funderEnterprise Irelanden
dc.contributor.funderAnalog Devicesen
dc.date.accessioned2010-04-21T13:01:26Z
dc.date.available2010-04-21T13:01:26Z
dc.date.issued2004-01
dc.date.updated2010-03-26T13:51:06Z
dc.description.abstractIn this brief, we demonstrate the procedures of linear model-based testing for the example of a 12-b Nyquist-rate analog-to-digital converter (ADC). In a production test environment, we apply this technique to two wafer lots of devices, and we establish that the model is robust with respect to its ability to reduce the uncertainty of the test outcome. Reducing this uncertainty is particularly beneficial for higher resolution devices, for which measurement noise increasingly corrupts the measured "signal" that is the nonlinearity of the device under test.en
dc.description.statusPeer revieweden
dc.description.versionPublished Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.citationWegener, C., Kennedy, M.P., 2004. Linear model-based testing of ADC nonlinearities. IEEE Transactions on Circuits and Systems I: Regular Papers, 51(1), pp. 213- 217. doi: 10.1109/TCSI.2003.821281en
dc.identifier.doi10.1109/TCSI.2003.821281
dc.identifier.endpage217en
dc.identifier.issn1549-8328
dc.identifier.issued1en
dc.identifier.journaltitleIEEE Transactions on Circuits and Systems I: Regular Papersen
dc.identifier.startpage213en
dc.identifier.urihttps://hdl.handle.net/10468/161
dc.identifier.volume51en
dc.language.isoenen
dc.publisherIEEEen
dc.rights©2004 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.en
dc.subjectLinear modelingen
dc.subjectNoise-induced test uncertaintyen
dc.subjectSpecification testen
dc.subjectTest cost reductionen
dc.subject.lcshIntegrated circuits -- Testingen
dc.subject.lcshAnalog-to-digital convertersen
dc.titleLinear model-based testing of ADC nonlinearitiesen
dc.typeArticle (peer-reviewed)en
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