Germanium oxide removal by citric acid and thiol passivation from citric acid terminated Ge(100)
dc.contributor.author | Collins, Gillian | |
dc.contributor.author | Aureau, Damien | |
dc.contributor.author | Holmes, Justin D. | |
dc.contributor.author | Etcheberry, Arnaud | |
dc.contributor.author | O'Dwyer, Colm | |
dc.contributor.funder | Irish Research Council | en |
dc.contributor.funder | Campus France | en |
dc.date.accessioned | 2016-02-15T14:33:51Z | |
dc.date.available | 2016-02-15T14:33:51Z | |
dc.date.issued | 2014-11-14 | |
dc.date.updated | 2014-12-15T11:12:40Z | |
dc.description.abstract | Many applications of germanium (Ge) are underpinned by effective oxide removal and surface passivation. This important surface treatment step often requires H–X (X = Cl, Br, I) or HF etchants. Here, we show that aqueous citric acid solutions are effective in the removal of GeOx. The stability of citric acid-treated Ge(100) is compared to HF and HCl treated surfaces and analyzed by X-ray photoelectron spectroscopy. Further Ge surface passivation was investigated by thiolation using alkane monothiols and dithiols. The organic passivation layers show good stability with no oxide regrowth observed after 3 days of ambient exposure. | en |
dc.description.sponsorship | Irish Research Council (Ulysses Research Programme with Campus France) | en |
dc.description.status | Peer reviewed | en |
dc.description.version | Accepted Version | en |
dc.format.mimetype | application/pdf | en |
dc.identifier.citation | Collins, G., Aureau, D., Holmes, J. D., Etcheberry, A. and O’Dwyer, C. (2014) 'Germanium Oxide Removal by Citric Acid and Thiol Passivation from Citric Acid-Terminated Ge(100)', Langmuir, 30(47), pp. 14123-14127. doi: 10.1021/la503819z | en |
dc.identifier.doi | 10.1021/la503819z | |
dc.identifier.endpage | 14127 | en |
dc.identifier.issn | 0743-7463 | |
dc.identifier.issued | 47 | en |
dc.identifier.journaltitle | Langmuir | en |
dc.identifier.startpage | 14123 | en |
dc.identifier.uri | https://hdl.handle.net/10468/2288 | |
dc.identifier.volume | 30 | en |
dc.language.iso | en | en |
dc.publisher | American Chemical Society | en |
dc.relation.uri | http://pubs.acs.org/doi/abs/10.1021/la503819z | |
dc.rights | © 2014 American Chemical Society. This document is the Accepted Manuscript version of a Published Work that appeared in final form in Langmuir, copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see https://pubs.acs.org/doi/abs/10.1021/la503819z | en |
dc.subject | Fourier transform infrared spectroscopy | en |
dc.subject | FTIR | en |
dc.subject | X-ray photoelectron spectroscopy | en |
dc.subject | XPS | en |
dc.subject | Ge(111) | en |
dc.subject | Surface functionalization | en |
dc.subject | Ge nanowires | en |
dc.subject | Silicon | en |
dc.subject | Nanoparticles | en |
dc.subject | Germanium | en |
dc.title | Germanium oxide removal by citric acid and thiol passivation from citric acid terminated Ge(100) | en |
dc.type | Article (peer-reviewed) | en |
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