Strain-induced hierarchical ripples in MoS2 layers investigated by atomic force microscopy

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dc.contributor.authorHussain, Sabir
dc.contributor.authorXu, Rui
dc.contributor.authorXu,, Kunqi
dc.contributor.authorLei, Le
dc.contributor.authorMeng, Lan
dc.contributor.authorZheng, Zhiyue
dc.contributor.authorXing, Shuya
dc.contributor.authorGuo, Jianfeng
dc.contributor.authorDong, Haoyu
dc.contributor.authorLiaqat, Adeel
dc.contributor.authorIqbal,, Muhammad Ahsan
dc.contributor.authorLi, Yan Jun
dc.contributor.authorSugawara, Yasuhiro
dc.contributor.authorPang, Fei
dc.contributor.authorJi, Wei
dc.contributor.authorLiming, Xie
dc.contributor.authorCheng, Zhihai
dc.contributor.funderNational Natural Science Foundation of China
dc.contributor.funderMinistry of Science and Technology of the People's Republic of China
dc.contributor.funderUniversity of Chinese Academy of Sciences
dc.contributor.funderNational Key Research and Development Program of China
dc.contributor.funderJapan Society for the Promotion of Science
dc.contributor.funderMinistry of Education, Culture, Sports, Science and Technology
dc.contributor.funderOsaka University
dc.contributor.funderYouth Innovation Promotion Association of the Chinese Academy of Sciences
dc.contributor.funderFundamental Research Funds for the Central Universities
dc.contributor.funderRenmin University of China
dc.date.accessioned2024-01-11T12:31:06Z
dc.date.available2024-01-03T14:35:09Zen
dc.date.available2024-01-11T12:31:06Z
dc.date.issued2020-10-12
dc.date.updated2024-01-03T14:35:11Zen
dc.description.abstractStrain engineering plays a vital role in controlling the physical properties of two-dimensional (2D) materials. However, the nanomechanical behavior of atomically thin 2D crystals under strain has not been completely understood. Here, strain-induced hierarchical ripple nanostructures in triangular MoS2 flakes were investigated by advanced atomic force microscopy and optical spectral measurements. The hierarchical nanoripples exhibited a threefold radial pattern, and their mechanical, electronic, and optical spectra characteristics were significantly modified due to the suffering from large tensile strain. Structure evolution of these hierarchical nanoripples was further discussed based on the geometry and thickness of MoS2 flakes, and we attributed the curtain effect at the limit of a single atomic layer. Our study will be beneficial in designing nanomechanical structures and prototype electromechanical devices with 2D materials.en
dc.description.sponsorshipNational Natural Science Foundation of China ((NSFC; Grant Nos. 21622304, 61674045, 11604063, 61911540074, 11622437, and 11974422)); Ministry of Science and Technology (MOST) of China (Grant Nos. 2016YFA0200700 and 2018YFE0202700); Strategic Priority Research Program, Key Research Program of Frontier Sciences and Instrument Developing Project of Chinese Academy of Sciences (CAS; Grant Nos. XDB30000000, QYZDB-SSW-SYS031, and YZ201418); Ministry of Education, Culture, Sports, Science, and Technology of Japan (Grant-in-Aid for Scientific Research from Japan Society for the Promotion of Science (JSPS) from the Ministry of Education, Culture, Sports, Science, and Technology of Japan (Nos. JP16H06327, JP16H06504, JP17H01061, and JP17H010610)); Osaka University's International Joint Research Promotion Program (Nos. J171013014, J171013007, J181013006, and Ja19990011); Youth Innovation Promotion Association CAS (Distinguished Technical Talents Project and Youth Innovation Promotion Association CAS); Renmin University of China (Fundamental Research Funds for the Central Universities, and the Research Funds of Renmin University of China (Grant No. 18XNLG01))
dc.description.statusPeer revieweden
dc.description.versionPublished Version
dc.format.mimetypeapplication/pdfen
dc.identifier.articleid153102
dc.identifier.citationHussain, S., Xu, R., Xu, K., Lei, L., Meng, L., Zheng, Z., Xing, S., Guo, J., Dong, H., Liaqat, A., Iqbal, M.A., Li, Y.J., Sugawara, Y., Pang, F., Ji, W., Xie, L. and Cheng, Z. (2020) ‘Strain-induced hierarchical ripples in MoS2 layers investigated by atomic force microscopy’, Applied Physics Letters, 117(15), p. 153102. Available at: https://doi.org/10.1063/5.0023405.
dc.identifier.doihttps://doi.org/10.1063/5.0023405
dc.identifier.endpage7
dc.identifier.issn0003-6951
dc.identifier.issn1077-3118
dc.identifier.issued15
dc.identifier.journaltitleApplied Physics Letters
dc.identifier.startpage1
dc.identifier.urihttps://hdl.handle.net/10468/15354
dc.identifier.volume117
dc.language.isoenen
dc.publisherAIP Publishing
dc.rights© 2020 Author(s). Published under license by AIP Publishing. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Appl. Phys. Lett. 117, 153102 (2020) and may be found at https://doi.org/10.1063/5.0023405
dc.subjectPhonons
dc.subjectSemiconductors
dc.subjectElectromechanics
dc.subjectElastic modulus
dc.subjectAtomic force microscopy
dc.subject2D materials
dc.subjectPhotoluminescence spectroscopy
dc.subjectThermal effects
dc.titleStrain-induced hierarchical ripples in MoS2 layers investigated by atomic force microscopy
dc.typeArticle (peer-reviewed)
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