A rigorous exposition of the LEMMA method for analog and mixed-signal testing.
| dc.contributor.author | Wrixon, Adrian F. | |
| dc.contributor.author | Kennedy, Michael Peter | |
| dc.contributor.funder | Science Foundation Ireland | en |
| dc.date.accessioned | 2010-06-04T11:06:57Z | |
| dc.date.available | 2010-06-04T11:06:57Z | |
| dc.date.copyright | 1999 | |
| dc.date.issued | 1999-10 | |
| dc.date.updated | 2010-05-24T15:15:15Z | |
| dc.description.abstract | The linear error-mechanism modeling technique is an effective tool for testing analog and mixed-signal devices which minimizes the number of measurements required to characterize the static transfer function of a circuit by determining a small number of parameters of a linear error model and then predicting the entire response error. This work focuses on optimizing the linear error-mechanism model algorithm (LEMMA), introducing novel refinements which are shown to improve its performance significantly. We outline the implementation of the algorithm in a tutorial manner, paying due consideration to the underlying theory where required. | en |
| dc.description.status | Peer reviewed | en |
| dc.description.version | Published Version | en |
| dc.format.mimetype | application/pdf | en |
| dc.identifier.citation | Wrixon, A., Kennedy, M.P., 1999. A rigorous exposition of the LEMMA method for analog and mixed-signal testing, IEEE Transactions on Instrumentation and Measurement, 48 (5), pp.978-985, Oct 1999 | en |
| dc.identifier.doi | 10.1109/19.799657 | |
| dc.identifier.endpage | 985 | en |
| dc.identifier.issn | 0018-9456 | |
| dc.identifier.issued | 5 | en |
| dc.identifier.journaltitle | IEEE Transactions on Instrumentation and Measurement | en |
| dc.identifier.startpage | 978 | en |
| dc.identifier.uri | https://hdl.handle.net/10468/183 | |
| dc.identifier.volume | 48 | en |
| dc.language.iso | en | en |
| dc.publisher | IEEE | en |
| dc.rights | ©1999 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. | en |
| dc.subject | Analog testing | en |
| dc.subject | Error-mechanism | en |
| dc.subject | Linear modeling | en |
| dc.subject | Mixed-signal testing | en |
| dc.subject | Test development | en |
| dc.subject.lcsh | Linear models | en |
| dc.title | A rigorous exposition of the LEMMA method for analog and mixed-signal testing. | en |
| dc.type | Article (peer-reviewed) | en |
