Nonlinear measurements of electrochromic WO3/LiNbO3/NiO at microwave frequencies

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dc.contributor.authorBulja, Senaden
dc.contributor.authorKozlov, Dmitryen
dc.contributor.authorNorooziarab, Majiden
dc.contributor.authorKopf, Roseen
dc.contributor.authorCappuzzo, Marken
dc.contributor.authorTate, Alen
dc.contributor.authorCahill, Roberten
dc.date.accessioned2023-08-03T14:56:15Z
dc.date.available2023-08-03T14:56:15Z
dc.date.issued2023-06-12en
dc.description.abstractIn this paper and for the first time, nonlinear behaviour of an electronically tuneable electrochromic (EC) thin film material is investigated experimentally at microwave frequencies. The measurement setup based on the single tone method uses identical topologies for test cells based on SiO2 or Silicone Dioxide (SD) and EC dielectric materials for a mutual comparison study of the nonlinear behaviour of the tuneable EC dielectric. The measured third-order intercept point of EC test cells is around 80 dBm, which is larger than typical values for other tuneable technologies such as ferroelectrics and liquid crystals (LCs).en
dc.description.statusPeer revieweden
dc.description.versionAccepted Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.citationBulja, S., Kozlov, D., Norooziarab, M., Kopf, R., Cappuzzo, M., Tate, A. and Cahill, R. (2023) 'Nonlinear measurements of electrochromic WO3/LiNbO3/NiO at microwave frequencies', 2023 IEEE Radio and Antenna Days of the Indian Ocean (RADIO), Balaclava, Mauritius, 1-4 May, pp. 1-2, doi: 10.1109/RADIO58424.2023.10146064en
dc.identifier.doi10.1109/radio58424.2023.10146064en
dc.identifier.endpage2en
dc.identifier.isbn979-8-3503-4791-3en
dc.identifier.isbn979-8-3503-4790-6en
dc.identifier.isbn979-8-3503-4792-0en
dc.identifier.startpage1en
dc.identifier.urihttps://hdl.handle.net/10468/14790
dc.language.isoenen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en
dc.relation.ispartof2023 IEEE Radio and Antenna Days of the Indian Ocean (RADIO), Balaclava, Mauritius, 1-4 Mayen
dc.rights© 2023, IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.en
dc.subjectAntenna measurementsen
dc.subjectSilicon compoundsen
dc.subjectOceansen
dc.subjectSea measurementsen
dc.subjectMicrowave frequenciesen
dc.subjectDielectric measurementen
dc.subjectGrapheneen
dc.titleNonlinear measurements of electrochromic WO3/LiNbO3/NiO at microwave frequenciesen
dc.typeConference itemen
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