Machine learning approaches for EM signature analysis in chipless RFID technology

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Rather, Nadeem
Simorangkir, Roy B.V. B.
Buckley, John L.
O'Flynn, Brendan
Tedesco, Salvatore
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Institute of Electrical and Electronics Engineers (IEEE)
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In this paper, for the first time, we provide a comprehensive review of Machine Learning (ML) approaches in Chipless Radio Frequency Identification (CRFID) technology, which is a fast-developing sector with applications in inventory management, anti-counterfeiting, health monitoring, and environmental monitoring, to name a few. ML techniques are rapidly being integrated to improve CRFID systems' capabilities for robust detection of information. The combination of ML with CRFID technology is presented, examining various ML approaches, applications, challenges, and future perspectives. It is observed that ML has been successfully deployed in CRFID with high accuracy in the detection of information from CRFID tags. Challenges, such as data quality, security, and scalability are identified. Moreover, the literature currently struggles in the application of ML models on high-capacity tags, and lacks standardized data collection and sharing methodologies. We suggest the development of common data collection protocols, data sharing initiatives, and collaboration to establish a cohesive framework for CRFID data-driven research.
Terms-chipless RFID , Deep learning , Electromagnetics , Machine learning , Radar cross section , RFID
Rather, N., Simorangkir, R. B. V. B., Buckley, J. L., O'Flynn, B. and Tedesco, S. (2024) 'Machine learning approaches for EM signature analysis in chipless RFID technology', 2024 18th European Conference on Antennas and Propagation (EuCAP), Glasgow, United Kingdom, 17-22 March 2024, pp. 1-5.
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