Probing of nanocontacts inside a transmission electron microscope

dc.contributor.authorErts, Donats
dc.contributor.authorLohmus, Ants
dc.contributor.authorHolmes, Justin D.
dc.contributor.authorOlin, Hakan
dc.date.accessioned2020-01-23T15:10:29Z
dc.date.available2020-01-23T15:10:29Z
dc.date.issued2007
dc.date.updated2020-01-22T20:31:08Z
dc.description.abstractIn the past twenty years, powerful tools such as atomic force microscopy have made it possible to accurately investigate the phenomena of friction and wear, down to the nanometer scale. Readers of this book will become familiar with the concepts and techniques of nanotribology, explained by an international team of scientists and engineers, actively involved and with long experience in this field. Edited by two pioneers in the field, 'Fundamentals of Frictions and Wear at the Nanoscale' is suitable both as first introduction to this fascinating subject, and also as a reference for researchers wishing to improve their knowledge of nanotribology and to keep up with the latest results in this field.en
dc.description.statusNot peer revieweden
dc.description.versionAccepted Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.citationErts, D., Lohmus, A., Holmes, J. D. and Olin, H. (2007) 'Probing of nanocontacts inside a transmission electron microscope', in Gnecco, E. and Meyer, E. (eds). Fundamentals of Friction and Wear on the Nanoscale, Springer-Verlag Berlin Heidelberg, pp. 73-100en
dc.identifier.doi10.1007/978-3-540-36807-6en
dc.identifier.endpage100en
dc.identifier.isbn978-3-540-36807-6
dc.identifier.issn1434-4904
dc.identifier.startpage73en
dc.identifier.urihttps://hdl.handle.net/10468/9568
dc.language.isoenen
dc.publisherSpringer-Verlag Berlin Heidelbergen
dc.relation.ispartofFundamentals of Friction and Wear on the Nanoscale
dc.relation.urihttps://www.springer.com/gp/book/9783540368076
dc.rights© 2007 Springer-Verlag Berlin Heidelberg. This is a post-peer-review, pre-copyedit version of a book chapter published in Fundamentals of Friction and Wear. The final authenticated version is available online at: https://www.springer.com/gp/book/9783540368076en
dc.subjectNanotribologyen
dc.subjectTransmission electron microscopy (TEM)en
dc.subjectTransmission electron microscopeen
dc.subjectScanning probe microscope (SPM)en
dc.subjectScanning probe microscopyen
dc.subjectImagingen
dc.titleProbing of nanocontacts inside a transmission electron microscopeen
dc.typeBook chapteren
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