Experimental analysis of variability in WS2-based devices for hardware security

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dc.contributor.authorVatalaro, M.en
dc.contributor.authorNeill, Hazelen
dc.contributor.authorGity, Farzanen
dc.contributor.authorMagnone, P.en
dc.contributor.authorMaccaronio, V.en
dc.contributor.authorMárquez, C.en
dc.contributor.authorGaldon, J. C.en
dc.contributor.authorGamiz, F.en
dc.contributor.authorCrupi, F.en
dc.contributor.authorHurley, Paulen
dc.contributor.authorDe Rose, R.en
dc.contributor.funderHorizon 2020en
dc.contributor.funderScience Foundation Irelanden
dc.contributor.funderMinistero dell’Istruzione, dell’Università e della Ricercaen
dc.date.accessioned2023-09-15T15:02:47Z
dc.date.available2023-09-15T15:02:47Z
dc.date.issued2023-06-24en
dc.description.abstractThis work investigates the variability of tungsten disulfide (WS2)-based devices by experimental characterization in view of possible application in the field of hardware security. To this aim, a preliminary analysis was performed by measurements across voltages and temperatures on a set of seven Si/SiO2/WS2 back-gated devices, also considering the effect of different stabilization conditions on their conductivity. Obtained results show appreciable variability in the conductivity, while also revealing similar dependence on bias and temperature across tested devices. Overall, our analysis demonstrates that WS2-based devices can be potentially exploited to ensure adequate randomness and robustness against environmental variations and then used as building blocks for hardware security primitives.en
dc.description.sponsorshipMinistero dell’Istruzione, dell’Università e della Ricerca (through the PRIN project FIVE2D (Contract No. 2017SRYEJH_001))en
dc.description.statusPeer revieweden
dc.description.versionPublished Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.articleid10870en
dc.identifier.citationVatalaro, M., Neill, H., Gity, F., Magnone, P., Maccaronio, V., Márquez, C., Galdon, J.C., Gamiz, F., Crupi, F., Hurley, P. and De Rose, R. (2023) ‘Experimental analysis of variability in WS2-based devices for hardware security’, Solid-State Electronics, 207, 108701 (6 pp). Available at: https://doi.org/10.1016/j.sse.2023.108701.en
dc.identifier.doi10.1016/j.sse.2023.108701en
dc.identifier.endpage6en
dc.identifier.issn0038-1101en
dc.identifier.journaltitleSolid-State Electronicsen
dc.identifier.startpage1en
dc.identifier.urihttps://hdl.handle.net/10468/14990
dc.identifier.volume207en
dc.language.isoenen
dc.publisherElsevieren
dc.relation.ispartofSolid-State Electronicsen
dc.relation.projectinfo:eu-repo/grantAgreement/EC/H2020::RIA/871130/EU/Access to European Infrastructure for Nanoelectronics/ASCENTPlusen
dc.relation.projectinfo:eu-repo/grantAgreement/SFI/SFI Research Centres Programme::Phase 2/12/RC/2278_P2/IE/AMBER_Phase 2/en
dc.relation.urihttps://doi.org/10.1016/j.sse.2023.108701en
dc.rights© 2023 The Authors. Published by Elsevier Ltd. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).en
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/en
dc.subject2D materialsen
dc.subjectTungsten disulfideen
dc.subjectCharacterizationen
dc.subjectVariabilityen
dc.subjectHardware securityen
dc.titleExperimental analysis of variability in WS2-based devices for hardware securityen
dc.typeArticle (peer-reviewed)en
oaire.citation.volume207en
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