Self calibrating wavelength multiplexed heterodyne interferometer for angstrom precision measurements

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dc.contributor.authorArain, Muzammil A.
dc.contributor.authorRiza, Nabeel A.
dc.date.accessioned2020-05-26T15:43:09Z
dc.date.available2020-05-26T15:43:09Z
dc.date.issued2005-05-24
dc.description.abstractMeasurement of refractive index, surface quality and temperature of the process materials in defense, petrochemical, power systems, glass, and metal industries is a fundamental need for precision systems performance. However, making these measurements in a super noisy defense or industrial environment is a big challenge faced by sensor technologies. Reported in this paper is the first ever demonstration of a wavelength multiplexed heterodyne interferometer using a single acousto-optic device (AOD). Heterodyne interferometry is pivotal in realizing a highly stable low noise interferometer. Inspite of the physical separation of the two arms of the interferometer, the sensor demonstrates Angstrom level optical path length sensitivity. The proposed sensor can be used in optical path length measurement-based sensing of parameters such as surface profile, refractive index, temperature, and pressure. Proof-of-concept experiment features a high resolution, low-loss, ultra compact, free space scanning interferometer implementation. Results include measurement of surface quality of a test mirror.en
dc.description.statusPeer revieweden
dc.description.versionPublished Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.citationArain, M. A. and Riza, N. A. (2005) 'Self calibrating wavelength multiplexed heterodyne interferometer for angstrom precision measurements', Proceedings of SPIE, 5814, Enabling Photonics Technologies for Defense, Security, and Aerospace Applications, (24 May). Defense and Security, 2005, Orlando, Florida, United States. doi: 10.1117/12.604906en
dc.identifier.doi10.1117/12.604906en
dc.identifier.endpage143en
dc.identifier.issn0277-786X
dc.identifier.issn1996-756X
dc.identifier.journaltitleProceedings of SPIEen
dc.identifier.startpage140en
dc.identifier.urihttps://hdl.handle.net/10468/10062
dc.identifier.volume5814en
dc.language.isoenen
dc.publisherSociety of Photo-optical Instrumentation Engineers (SPIE)en
dc.rights© 2005 Society of Photo-Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.en
dc.subjectAcousto-optic devicesen
dc.subjectHeterodyne optical interferometersen
dc.subjectOptical sensorsen
dc.subjectScanning interferometersen
dc.subjectInterferometersen
dc.subjectHeterodyningen
dc.subjectSignal detectionen
dc.subjectMultiplexingen
dc.subjectAcousto-opticsen
dc.subjectFree space opticsen
dc.subjectOptical testingen
dc.titleSelf calibrating wavelength multiplexed heterodyne interferometer for angstrom precision measurementsen
dc.typeConference itemen
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