Room temperature electromechanical and magnetic investigations of ferroelectric Aurivillius phase Bi5Ti3(FexMn1−x)O15 (x = 1 and 0.7) chemical solution deposited thin films

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dc.contributor.authorKeeney, Lynette
dc.contributor.authorGroh, Claudia
dc.contributor.authorKulkarni, Santosh
dc.contributor.authorRoy, Saibal
dc.contributor.authorPemble, Martyn E.
dc.contributor.authorWhatmore, Roger W.
dc.contributor.funderScience Foundation Irelanden
dc.date.accessioned2016-08-15T15:27:57Z
dc.date.available2016-08-15T15:27:57Z
dc.date.issued2012-07
dc.date.updated2014-09-03T10:35:02Z
dc.description.abstractAurivillius phase thin films of Bi5Ti3(FexMn1−x)O15 with x = 1 (Bi5Ti3FeO15) and 0.7 (Bi5Ti3Fe0.7Mn0.3O15) on SiO2-Si(100) and Pt/Ti/SiO2-Si substrates were fabricated by chemical solution deposition. The method was optimized in order to suppress formation of pyrochlore phase Bi2Ti2O7 and improve crystallinity. The structuralproperties of the films were examined by x-ray diffraction, scanning electron microscopy, and atomic force microscopy. Optimum crystallinity and pyrochlore phase suppression was achieved by the addition of 15 to 25 mol. % excess bismuth to the sols. Based on this study, 17.5 mol. % excess bismuth was used in the preparation of Bi2Ti2O7-free films of Bi5Ti3FeO15 on SrTiO3(100) and NdGaO3(001) substrates, confirming the suppression of pyrochlore phase using this excess of bismuth. Thirty percent of the Fe3+ ions in Bi5Ti3FeO15 was substituted with Mn3+ ions to form Bi2Ti2O7-free thin films of Bi5Ti3Fe0.7Mn0.3O15 on Pt/Ti/SiO2-Si, SiO2-Si(100), SrTiO3(100), and NdGaO3(001) substrates. Bi5Ti3FeO15 and Bi5Ti3Fe0.7Mn0.3O15thin films on Pt/Ti/SiO2-Si and SiO2-Si(100) substrates were achieved with a higher degree of a-axis orientation compared with the films on SrTiO3(100) and NdGaO3(001) substrates. Room temperature electromechanical and magnetic properties of the thin films were investigated in order to assess the potential of these materials for piezoelectric,ferroelectric, and multiferroic applications. Vertical piezoresponse force microscopy measurements of the films demonstrate that Bi5Ti3FeO15 and Bi5Ti3Fe0.7Mn0.3O15thin films are piezoelectric at room temperature. Room temperature switching spectroscopy-piezoresponse force microscopy measurements in the presence and absence of an applied bias demonstrate local ferroelectric switching behaviour (180°) in the films. Superconducting quantum interference device magnetometry measurements do not show any room temperature ferromagnetic hysteresis down to an upper detection limit of 2.53 × 10−3 emu; and it is concluded, therefore, that such films are not mutiferroic at room temperature. Piezoresponse force microscopy lithography images of Bi5Ti3Fe0.7Mn0.3O15thin films are presented.en
dc.description.sponsorshipScience Foundation Ireland (SFI FORME Strategic Research Cluster Award No. 07/SRC/I1172 i)en
dc.description.statusPeer revieweden
dc.description.versionPublished Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.articleid024101
dc.identifier.citationKeeney, L., Groh, C., Kulkarni, S., Roy, S., Pemble, M. E. and Whatmore, R. W. (2012) ‘Room temperature electromechanical and magnetic investigations of ferroelectric Aurivillius phase Bi5Ti3(FexMn1−x)O15 (x = 1 and 0.7) chemical solution deposited thin films’, Journal of Applied Physics 112(2), 024101. http://dx.doi.org/10.1063/1.4734983en
dc.identifier.doi10.1063/1.4734983
dc.identifier.endpage024101-9en
dc.identifier.issn0021-8979
dc.identifier.issn1089-7550
dc.identifier.issued2en
dc.identifier.journaltitleJournal of Applied Physicsen
dc.identifier.startpage024101-1en
dc.identifier.urihttps://hdl.handle.net/10468/2990
dc.identifier.volume112en
dc.language.isoenen
dc.rights© 2012 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in L. Keeney et al. J. Appl. Phys. 112, 024101 (2012) and may be found at http://dx.doi.org/10.1063/1.4734983en
dc.subjectX-ray diffractionen
dc.subjectAtomic force microscopyen
dc.subjectBismuth compoundsen
dc.subjectFerritesen
dc.subjectFerroelectric ceramicsen
dc.subjectFerroelectric switchingen
dc.subjectFerroelectric thin filmsen
dc.subjectLiquid phase depositionen
dc.subjectMagnetisationen
dc.subjectMultiferroicsen
dc.subjectPiezoceramicsen
dc.subjectPiezoelectric thin filmsen
dc.subjectPiezoelectricityen
dc.subjectScanning electron microscopyen
dc.subjectTitanium compoundsen
dc.titleRoom temperature electromechanical and magnetic investigations of ferroelectric Aurivillius phase Bi5Ti3(FexMn1−x)O15 (x = 1 and 0.7) chemical solution deposited thin filmsen
dc.typeArticle (peer-reviewed)en
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