Optical reflectivity of spin-coated multilayered ZnO and Al:ZnO Thin Films

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dc.contributor.authorBuckley, Darragh
dc.contributor.authorMcCormack, Robert
dc.contributor.authorMcNulty, David
dc.contributor.authorZubialevich, Vitaly Z.
dc.contributor.authorParbrook, Peter J.
dc.contributor.authorO'Dwyer, Colm
dc.contributor.funderIrish Research Councilen
dc.contributor.funderScience Foundation Irelanden
dc.date.accessioned2018-05-22T11:50:23Z
dc.date.available2018-05-22T11:50:23Z
dc.date.issued2017-05
dc.date.updated2018-05-16T00:50:48Z
dc.description.abstractControlling growth, doping, crystallization, thickness of thin films of thin film transistor (TFT) channel materials is required in order to improve and control physical properties, primarily electronic conductivity and optical transparency. With the advent of flexible electronics and curved TFT-based display panels, low cost, solution-processed methods are important and provide scalable coating methods on a range of substrates. This work demonstrates the changes to the morphology, crystalline structure, optical reflectivity and electrical conductance of solution-processed ZnO thin films by the inclusion of an aluminium dopant during spin-coating. The measurements also determine the compositional chemical state of the Al:ZnO structures compared to ZnO using X-ray photoelectron spectroscopy in conjunction with detailed X-ray diffraction and transmission electron microscopy examination of the film morphology.en
dc.description.sponsorshipIrish Research Council (award GOIPG/2014/206);en
dc.description.statusPeer revieweden
dc.description.versionAccepted Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.citationBuckley, D., McCormack, R., McNulty, D., Zubialevich, V. Z., Parbrook, P. J. and O'Dwyer, C. (2017) 'Optical Reflectivity of Spin-Coated Multilayered ZnO and Al:ZnO Thin Films', ECS Transactions, 77(6), pp. 75-82. doi: 10.1149/07706.0075ecsten
dc.identifier.doi10.1149/07706.0075ecst
dc.identifier.endpage82en
dc.identifier.issn1938-5862
dc.identifier.issn1938-6737
dc.identifier.journaltitleECS Transactionsen
dc.identifier.startpage75en
dc.identifier.urihttps://hdl.handle.net/10468/6174
dc.identifier.volume77en
dc.language.isoenen
dc.publisherElectrochemical Societyen
dc.relation.projectinfo:eu-repo/grantAgreement/SFI/SFI Technology and Innovation Development Award (TIDA)/15/TIDA/2893/IE/Advanced Battery Materials for High Volumetric Energy Density Li-ion Batteries for Remote Off-Grid Power/en
dc.relation.projectinfo:eu-repo/grantAgreement/SFI/SFI Investigator Programme/14/IA/2581/IE/Diffractive optics and photonic probes for efficient mouldable 3D printed battery skin materials for portable electronic devices/en
dc.relation.urihttp://ecst.ecsdl.org/content/77/6/75.abstract
dc.rights© 2017 ECS - The Electrochemical Societyen
dc.subjectThin filmsen
dc.subjectChannel materialsen
dc.subjectCoating methodsen
dc.subjectCrystalline structureen
dc.subjectElectrical conductanceen
dc.subjectElectronic conductivityen
dc.subjectOptical reflectivityen
dc.subjectOptical transparencyen
dc.subjectSolution-processeden
dc.subjectCoatingsen
dc.subjectEnergy gapen
dc.subjectFilm growthen
dc.subjectFilm thicknessen
dc.subjectFilmsen
dc.subjectFlexible displaysen
dc.subjectFlexible electronicsen
dc.subjectHigh resolution transmission electron microscopyen
dc.subjectReflectionen
dc.subjectSemiconductor devicesen
dc.subjectSemiconductor dopingen
dc.subjectSemiconductor materialsen
dc.subjectSubstratesen
dc.subjectThin film transistorsen
dc.subjectTransmission electron microscopyen
dc.subjectWide band gap semiconductorsen
dc.subjectX ray diffractionen
dc.subjectX ray photoelectron spectroscopyen
dc.subjectZinc oxideen
dc.titleOptical reflectivity of spin-coated multilayered ZnO and Al:ZnO Thin Filmsen
dc.typeArticle (peer-reviewed)en
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