Self calibrating wavelength multiplexed heterodyne interferometer for angstrom precision measurements

Show simple item record

dc.contributor.author Arain, Muzammil A.
dc.contributor.author Riza, Nabeel A.
dc.date.accessioned 2020-05-26T15:43:09Z
dc.date.available 2020-05-26T15:43:09Z
dc.date.issued 2005-05-24
dc.identifier.citation Arain, M. A. and Riza, N. A. (2005) 'Self calibrating wavelength multiplexed heterodyne interferometer for angstrom precision measurements', Proceedings of SPIE, 5814, Enabling Photonics Technologies for Defense, Security, and Aerospace Applications, (24 May). Defense and Security, 2005, Orlando, Florida, United States. doi: 10.1117/12.604906 en
dc.identifier.volume 5814 en
dc.identifier.startpage 140 en
dc.identifier.endpage 143 en
dc.identifier.issn 0277-786X
dc.identifier.issn 1996-756X
dc.identifier.uri http://hdl.handle.net/10468/10062
dc.identifier.doi 10.1117/12.604906 en
dc.description.abstract Measurement of refractive index, surface quality and temperature of the process materials in defense, petrochemical, power systems, glass, and metal industries is a fundamental need for precision systems performance. However, making these measurements in a super noisy defense or industrial environment is a big challenge faced by sensor technologies. Reported in this paper is the first ever demonstration of a wavelength multiplexed heterodyne interferometer using a single acousto-optic device (AOD). Heterodyne interferometry is pivotal in realizing a highly stable low noise interferometer. Inspite of the physical separation of the two arms of the interferometer, the sensor demonstrates Angstrom level optical path length sensitivity. The proposed sensor can be used in optical path length measurement-based sensing of parameters such as surface profile, refractive index, temperature, and pressure. Proof-of-concept experiment features a high resolution, low-loss, ultra compact, free space scanning interferometer implementation. Results include measurement of surface quality of a test mirror. en
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher Society of Photo-optical Instrumentation Engineers (SPIE) en
dc.rights © 2005 Society of Photo-Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. en
dc.subject Acousto-optic devices en
dc.subject Heterodyne optical interferometers en
dc.subject Optical sensors en
dc.subject Scanning interferometers en
dc.subject Interferometers en
dc.subject Heterodyning en
dc.subject Signal detection en
dc.subject Multiplexing en
dc.subject Acousto-optics en
dc.subject Free space optics en
dc.subject Optical testing en
dc.title Self calibrating wavelength multiplexed heterodyne interferometer for angstrom precision measurements en
dc.type Conference item en
dc.internal.authorcontactother Nabeel Riza, Electrical & Electronic Engineering, University College Cork, Cork, Ireland. +353-21-490-3000 Email: n.riza@ucc.ie en
dc.internal.availability Full text available en
dc.description.version Published Version en
dc.description.status Peer reviewed en
dc.identifier.journaltitle Proceedings of SPIE en
dc.internal.IRISemailaddress n.riza@ucc.ie en


Files in this item

This item appears in the following Collection(s)

Show simple item record

This website uses cookies. By using this website, you consent to the use of cookies in accordance with the UCC Privacy and Cookies Statement. For more information about cookies and how you can disable them, visit our Privacy and Cookies statement