Evaluating the surface chemistry of black phosphorus during ambient degradation
van Druenen, Maart; Davitt, Fionán; Collins, Timothy W.; Glynn, Colm; O'Dwyer, Colm; Holmes, Justin D.; Collins, Gillian
Date:
2019-01-14
Copyright:
© 2019, American Chemical Society. This document is the Accepted Manuscript version of a Published Work that appeared in final form in Langmuir, © American Chemical Society, after peer review and technical editing by the publisher. To access the final edited and published work see https://pubs.acs.org/doi/abs/10.1021/acs.langmuir.8b04190
Full text restriction information:
Access to this article is restricted until 12 months after publication by request of the publisher.
Restriction lift date:
2020-01-14
Citation:
van Druenen, M., Davitt, F., Collins, T., Glynn, C., O’Dwyer, C., Holmes, J. D. and Collins, G. (2019) 'Evaluating the Surface Chemistry of Black Phosphorus during Ambient Degradation', Langmuir, 35(6), pp. 2172-2178. doi:10.1021/acs.langmuir.8b04190
Abstract:
Black Phosphorus (BP) is emerging as a promising candidate for electronic, optical and energy storage applications, however its poor ambient stability remains a critical challenge. Evaluation of few-layer liquid exfoliated BP during ambient exposure using x-ray photoelectron spectroscopy (XPS) and Fourier transform infrared spectroscopy (FTIR) allows its surface chemistry to be investigated. Oxidation of liquid exfoliated few-layer BP initially occurs through non-bridged oxide species, which convert to bridged oxide species after ambient exposure. We demonstrate the instability of these bridged oxide species which undergo hydrolysis to form volatile phosphorus oxides and evaporate from the BP surface. FTIR spectroscopy, scanning transmission electron microscopy and atomic force microscopy were used to confirm the formation of liquid oxides through a continuous oxidation cycle that results in the decomposition of BP. Furthermore, we show that the instability of few-layer BP originates from the formation of bridged oxide species.
Show full item record