Microthermography of diode lasers: The impact of light propagation on image formation
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Published Version
Date
2009-01-06
Authors
LeClech, Julien
Ziegler, Mathias
Mukherjee, Jayanta
Tomm, Jens W.
Elsaesser, Thomas
Landesman, Jean-Pierre
Corbett, Brian M.
McInerney, John G.
Reithmaier, Johann Peter
Deubert, Stefan
Journal Title
Journal ISSN
Volume Title
Publisher
AIP Publishing
Published Version
Abstract
We analyze the effect of propagating infrared thermal radiation within a diode laser on its thermal image taken by a thermocamera. A ray-tracing analysis shows that this effect substantially influences image formation on a spatial scale of 10 mu m, i.e., in the domain of microthermography. The main parameter affecting the thermal radiation spread in the semitransparent semiconductor structure is the free carrier concentration in the substrate, governing its absorption. Two applications are presented: a quantum dot laser and a quantum-well laser, where independent thermal models are developed using the finite element method (FEM). Our ray-tracing analysis verifies the FEM simulated temperature profiles by interlinking them to experimental temperature maps obtained through microthermography. This represents a versatile experimental method for extracting reliable bulk-temperature data from diode lasers on a microscopic scale.
Description
Keywords
High-Power , Epitaxy , Channel waveguidesIon implantation , Field emission microscopy , Thermal imaging , Thermal radiation , Laser diodes , Quantum dots
Citation
LeClech, J., Ziegler, M., Mukherjee, J., Tomm, J. W., Elsaesser, T., Landesman, J.-P., Corbett, B., Mclnerney, J. G., Reithmaier, J. P., Deubert, S., Forchel, A., Nakwaski, W. and Sarzała, R. P. (2009) 'Microthermography of diode lasers: The impact of light propagation on image formation', Journal of Applied Physics, 105(1), pp. 014502. doi: 10.1063/1.3055356
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© 2009 American Institute of Physics, This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in LeClech, J., Ziegler, M., Mukherjee, J., Tomm, J. W., Elsaesser, T., Landesman, J.-P., Corbett, B., Mclnerney, J. G., Reithmaier, J. P., Deubert, S., Forchel, A., Nakwaski, W. and Sarzała, R. P. (2009) 'Microthermography of diode lasers: The impact of light propagation on image formation', Journal of Applied Physics, 105(1), pp. 014502 and may be found at http://aip.scitation.org/doi/abs/10.1063/1.3055356