Advancements in GaN-based horizontal-cavity and surface-emitting superluminescent diodes for next-generation holographic displays
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Date
2025-03-19
Authors
Muhammet, Genc
Li, Zhi
Morales, Juan S. D.
Hazarika, Abhinandan
Hwang, How Yuan
Akşit, Kaan
O'Carroll, Gerry
Roycroft, Brendan
Corbett, Brian M.
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Publisher
Society of Photo-Optical Instrumentation Engineers (SPIE)
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Abstract
Surface-emitting superluminescent diodes (SLDs) with horizontal cavities in the visible spectrum offer a significant advancement in optoelectronics, combining the benefits of LEDs and laser diodes. Characterized by broad emission spectrum, directionality, and high output power, SLDs are ideal for applications requiring high-brightness, high spatial coherence, and low temporal coherence, such as imaging and projection systems due to their speckle-free emission. This study focuses on SLDs emitting in the blue spectral region using gallium nitride (GaN) materials. Advanced fabrication techniques yielded a surface-emitting architecture using horizontal ridge waveguiding with a 45° total internal reflector on the facets, achieving high power and broad spectral output. The SLDs demonstrated a peak emission wavelength in the 4xx nm range with FWHM of 2-8 nm, depending on cavity length, and peak optical output power up to 1 W under pulse conditions. These features make SLDs cost-effective and suitable for next-gen optical systems, including holographic display applications, highlighting their potential for widespread adoption in high-performance technologies.
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Keywords
Surface emission , Superluminescence , Speckle-free light , Cost effective , High power , Holography , AR/VR
Citation
Genc, M., Li, Z., Morales, J., Hazarika, A., Hwang, H.Y., Aksit, K., O’Carroll, G., Roycroft, B. and Corbett, B. (2025) 'Advancements in GaN-based horizontal-cavity and surface-emitting superluminescent diodes for next-generation holographic displays', Proceedings of SPIE, 13366, Gallium Nitride Materials and Devices XX. San Francisco, United States, 25-31 January 2025. https://doi.org/10.1117/12.3044125
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© 2025, Society of Photo-Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.