Harsh environments minimally invasive optical sensing technique for extreme temperatures: 1000 degrees C and approaching 2500 degrees C

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dc.contributor.authorRiza, Nabeel A.
dc.contributor.authorArain, Muzamil A.
dc.contributor.authorPerez, Frank
dc.contributor.funderU.S. Department of Energyen
dc.date.accessioned2020-05-27T12:54:10Z
dc.date.available2020-05-27T12:54:10Z
dc.date.issued2005-05-23
dc.description.abstractTo the best of our knowledge, for the first time is designed and demonstrated a single crystal Silicon Carbide (SiC)-based minimally invasive smart optical sensor suited for harsh environments and temperatures reaching 2500 °C. The novel sensor design is based on an agile wavelength source, instantaneous single wavelength interferometry, full optical power cycle data acquisition, free-space targeted laser beam, multiple single crystal thick SiC optical frontend chips, and multi-wavelength signal processing for unambiguous temperature measurements to form a fast and distributed smart optical sensor system. Experiments conducted using a 1550 nm eye safe band tunable laser and a 300 micron coating-free thick SiC chip demonstrate temperature sensing from room temperature to 1000 °C with a measured 1.3 °C resolution. Applications for the proposed sensor include use in fossil fuel-based power systems, aerospace/aircraft systems, satellite systems, deep space exploration systems, and drilling and oil mining industries.en
dc.description.sponsorshipU.S. Department of Energy (Grant to Nuonics Inc.)en
dc.description.statusPeer revieweden
dc.description.versionPublished Versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.citationRiza, N. A., Arain, M. and Perez, F. (2005) 'Harsh environments minimally invasive optical sensing technique for extreme temperatures: 1000 degrees C and approaching 2500 degrees C', Proceeedings of SPIE, 5855, 17th International Conference on Optical Fibre Sensors, Bruges, Belgium, 23 May, pp. 687-690. doi: 10.1117/12.623399en
dc.identifier.doi10.1117/12.623399en
dc.identifier.eissn1996-756X
dc.identifier.endpage690en
dc.identifier.issn0277-786X
dc.identifier.journaltitleProceedings of SPIEen
dc.identifier.startpage687en
dc.identifier.urihttps://hdl.handle.net/10468/10068
dc.identifier.volume5855en
dc.language.isoenen
dc.publisherSociety of Photo-optical Instrumentation Engineers (SPIE)en
dc.rights© 2005 Society of Photo-Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.en
dc.subjectHigh temperature sensoren
dc.subjectHarsh environmenten
dc.subjectOptical sensoren
dc.subjectSilicon Carbideen
dc.subjectSensorsen
dc.subjectTemperature metrologyen
dc.subjectFabry–Perot interferometersen
dc.subjectCrystalsen
dc.subjectOptical sensorsen
dc.subjectEnvironmental sensingen
dc.subjectEnvironmental sensingen
dc.titleHarsh environments minimally invasive optical sensing technique for extreme temperatures: 1000 degrees C and approaching 2500 degrees Cen
dc.typeConference itemen
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